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Metrology
Non Contact Resistance and Resistivity Measurement
Metrology and Wafer Inspection
Wafer Edge Defect Inspection
Visual Wafer Inspection
Wafer Transfer Systems
Wafer Handling Systems
Wafer Tools
Wafer Sorter
Wafer ID Reader
Vacuum Wands
Process Tool Automation
Contact
Home
Metrology
Non Contact Resistance and Resistivity Measurement
Metrology and Wafer Inspection
Wafer Edge Defect Inspection
Visual Wafer Inspection
Wafer Transfer Systems
Wafer Handling Systems
Wafer Tools
Wafer Sorter
Wafer ID Reader
Vacuum Wands
Process Tool Automation
Contact
Metrology and Wafer Inspection
Further information
Metrology and Wafer Inspection
Different Application such as:
Form Deviation and Waviness
Wafer Thinning – CMP
Full Field Measurment with analyzing data
Surface Inspection
Thin Film Mapping
Surface Defect Detection
Stress Map
DIP-View VISION
Small Samples
manual loading
DIP-View VISION
up to 300mm wafer sizes
manual loading
DIP-View VISION 200/300
up to 300mm wafer sizes
automatic operating
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